[Beowulf] Conf. Wavelet Applications in Industrial Processing V: general deadline prolongation for Optics East 07

Wavelet colloque wavelet at iutlecreusot.u-bourgogne.fr
Tue May 15 02:08:09 PDT 2007

 >>> General deadline prolongation for Optics East 07 <<<
                         Abstract Due Date : 18 May

Wavelet Applications in Industrial Processing V (SA109)
Part of SPIE’s International Symposium on Optics East 2007
9-12 September 2007 • Seaport World Trade Center • Boston, MA, USA

--- Abstract Due Date : 18 May 2007 ---
--- Manuscript Due Date: 13 August 2007 ---

Web site

ABSTRACT TEXT  Approximately 500 words.

Conference Chairs: Frédéric Truchetet, Univ. de Bourgogne (France);  
Olivier Laligant, Univ. de Bourgogne (France)

Program Committee: Patrice Abry, École Normale Supérieure de Lyon  
(France); Radu V. Balan, Siemens Corporate Research; Atilla M.  
Baskurt, Univ. Claude Bernard Lyon 1 (France); Amel Benazza-Benyahia,  
Ecole Supérieure des Communications de Tunis (Tunisia); Albert  
Bijaoui, Observatoire de la Côte d'Azur (France); Seiji Hata, Kagawa  
Univ. (Japan); Henk J. A. M. Heijmans, Ctr. for Mathematics and  
Computer Science (Netherlands); William S. Hortos, Associates in  
Communication Engineering Research and Technology; Jacques Lewalle,  
Syracuse Univ.; Wilfried R. Philips, Univ. Gent (Belgium); Alexandra  
Pizurica, Univ. Gent (Belgium); Guoping Qiu, The Univ. of Nottingham  
(United Kingdom); Hamed Sari-Sarraf, Texas Tech Univ.; Peter  
Schelkens, Vrije Univ. Brussel (Belgium); Paul Scheunders, Univ.  
Antwerpen (Belgium); Kenneth W. Tobin, Jr., Oak Ridge National Lab.;  
Günther K. G. Wernicke, Humboldt-Univ. zu Berlin (Germany); Gerald  
Zauner, Fachhochschule Wels (Austria)

The wavelet transform, multiresolution analysis, and other space- 
frequency or space-scale approaches are now considered standard tools  
by researchers in image and signal processing. Promising practical  
results in machine vision and sensors for industrial applications and  
non destructive testing have been obtained, and a lot of ideas can be  
applied to industrial imaging projects.
This conference is intended to bring together practitioners,  
researchers, and technologists in machine vision, sensors, non  
destructive testing, signal and image processing to share recent  
developments in wavelet and multiresolution approaches. Papers  
emphasizing fundamental methods that are widely applicable to  
industrial inspection and other industrial applications are  
especially welcome.

Papers are solicited but not limited to the following areas:

o New trends in wavelet and multiresolution approach, frame and  
overcomplete representations, Gabor transform, space-scale and space- 
frequency analysis, multiwavelets, directional wavelets, lifting  
scheme for:
- sensors
- signal and image denoising, enhancement, segmentation, image  
- texture analysis
- pattern recognition
- shape recognition
- 3D surface analysis, characterization, compression
- acoustical signal processing
- stochastic signal analysis
- seismic data analysis
- real-time implementation
- image compression
- hardware, wavelet chips.

o Applications:
- machine vision
- aspect inspection
- character recognition
- speech enhancement
- robot vision
- image databases
- image indexing or retrieval
- data hiding
- image watermarking
- non destructive evaluation
- metrology
- real-time inspection.

o Applications in microelectronics manufacturing, web and paper  
products, glass, plastic, steel, inspection, power production,  
chemical process, food and agriculture, pharmaceuticals, petroleum  
All submissions will be peer reviewed. Please note that abstracts  
must be at least 500 words in length in order to receive full  

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