[Beowulf] Call for papers : Wavelet Applications in Industrial Processing IV
wavelet at iutlecreusot.u-bourgogne.fr
Wed Mar 22 07:14:55 PST 2006
*** Call for Papers and Announcement ***
Wavelet Applications in Industrial Processing IV (SA209)
Part of SPIE’s International Symposium on Optics East 2006
1-4 October 2006 • Boston Marriott Copley Place • Boston, MA, USA
--- Abstract Due Date: 25 March 2006 ---
--- Manuscript Due Date: 4 September 2006 ---
Conference Chairs: Frédéric Truchetet, Univ. de Bourgogne (France);
Olivier Laligant, Univ. de Bourgogne (France)
Program Committee: Patrice Abry, École Normale Supérieure de Lyon
(France); Radu V. Balan, Siemens Corporate Research; Atilla M.
Baskurt, Univ. Claude Bernard Lyon 1 (France); Amel Benazza-Benyahia,
Ecole Supérieure des Communications de Tunis (Tunisia); Albert
Bijaoui, Observatoire de la Côte d'Azur (France); Seiji Hata, Kagawa
Univ. (Japan); Henk J. A. M. Heijmans, Ctr. for Mathematics and
Computer Science (Netherlands); Jacques Lewalle, Syracuse Univ.;
Wilfried R. Philips, Univ. Gent (Belgium); Alexandra Pizurica, Univ.
Gent (Belgium); Guoping Qiu, The Univ. of Nottingham (United
Kingdom); Hamed Sari-Sarraf, Texas Tech Univ.; Peter Schelkens, Vrije
Univ. Brussel (Belgium); Paul Scheunders, Univ. Antwerpen (Belgium);
Kenneth W. Tobin, Jr., Oak Ridge National Lab.; Günther K. G.
Wernicke, Humboldt-Univ. zu Berlin (Germany); Gerald Zauner,
Fachhochschule Wels (Austria)
The wavelet transform, multiresolution analysis, and other space-
frequency or space-scale approaches are now considered standard tools
by researchers in image and signal processing. Promising practical
results in machine vision and sensors for industrial applications and
non destructive testing have been obtained, and a lot of ideas can be
applied to industrial imaging projects.
This conference is intended to bring together practitioners,
researchers, and technologists in machine vision, sensors, non
destructive testing, signal and image processing to share recent
developments in wavelet and multiresolution approaches. Papers
emphasizing fundamental methods that are widely applicable to
industrial inspection and other industrial applications are
Papers are solicited but not limited to the following areas:
o New trends in wavelet and multiresolution approach, frame and
overcomplete representations, Gabor transform, space-scale and space-
frequency analysis, multiwavelets, directional wavelets, lifting
- signal and image denoising, enhancement, segmentation,
- texture analysis
- pattern recognition
- shape recognition
- 3D surface analysis, characterization, compression
- acoustical signal processing
- stochastic signal analysis
- seismic data analysis
- real-time implementation
- image compression
- hardware, wavelet chips.
- machine vision
- aspect inspection
- character recognition
- speech enhancement
- robot vision
- image databases
- image indexing or retrieval
- data hiding
- image watermarking
- non destructive evaluation
- real-time inspection.
o Applications in microelectronics manufacturing, web and paper
products, glass, plastic, steel, inspection, power production,
chemical process, food and agriculture, pharmaceuticals, petroleum
All submissions will be peer reviewed. Please note that abstracts
must be at least 500 words in length in order to receive full
! Abstract Due Date: 25 March 2006 !
! Manuscript Due Date: 4 September 2006 !
------------- Submission of Abstracts for Optics East 2006 Symposium
Abstract Due Date: 25 March 2006 Manuscript Due Date: 4 September 2006
- Submissions imply the intent of at least one author to register,
attend the symposium, present the paper (either orally or in poster
format), and submit a full-length manuscript for publication in the
- All authors (including invited or solicited speakers), program
committee members, and session chairs are responsible for registering
and paying the reduced author, session chair, program committee
registration fee. (Current SPIE Members receive a discount on the
* Instructions for Submitting Abstracts via Web
- You are STRONGLY ENCOURAGED to submit abstracts using the “submit
an abstract” link at:
- Submitting directly on the Web ensures that your abstract will be
immediately accessible by the conference chair for review through
MySPIE, SPIE’s author/chair web site.
Please note! When submitting your abstract you must provide contact
information for all authors, summarize your paper, and identify the
contact author who will receive correspondence about the submission
and who must submit the manuscript and all revisions. Please have
this information available before you
begin the submission process.
- First-time users of MySPIE can create a new account by clicking on
the create new account link. You can simplify account creation by
using your SPIE ID# which is found on SPIE membership cards or the
label of any SPIE mailing.
- Your abstract submission must include all of the following:
1. PAPER TITLE
2. AUTHORS (principal author first) For each author:
o First (given) Name (initials not acceptable)
o Last (family) Name
o Mailing Address
o Telephone Number
o Fax Number
o Email Address
3. PRESENTATION PREFERENCE "Oral Presentation" or "Poster Presentation."
4. PRINCIPAL AUTHOR’S BIOGRAPHY Approximately 50 words.
5. EXTENDED ABSTRACT TEXT must be at least 500 words long and must
include: Introduction, Method, Results, and Conclusion.
6. KEYWORDS Maximum of five keywords.
If you do not have web access, you may E-MAIL each abstract
separately to: abstracts at spie.org in ASCII text (not encoded)
format. There will be a time delay for abstracts submitted via e-
mail as they will not be immediately processed for chair review.
IMPORTANT! To ensure proper processing of your abstract, the SUBJECT
line must include only:
SUBJECT: SA209, TRUCHETET, LALIGANT
* Accepted Abstracts
A CD-ROM of accepted abstracts will be distributed to attendees
onsite. Please only submit 500-word abstracts that are suitable for
* Conditions of Acceptance
- Authors are expected to secure funding for registration fees,
travel, and accommodations, independent of SPIE, through their
sponsoring organizations before submitting abstracts.
- Only original material should be submitted.
- Commercial papers, papers with no new research/development content,
and papers where supporting data or a technical description cannot be
given for proprietary reasons will not be accepted for presentation
in this symposium.
- Abstracts should contain enough detail to clearly convey the
approach and the results of the research.
- Government and company clearance to present and publish should be
final at the time of submittal. If you are a DoD contractor, allow at
least 60 days for clearance. Authors are required to warrant to SPIE
in advance of publication of the Proceedings that all necessary
permissions and clearances have been obtained, and that submitting
authors are authorized to transfer copyright of the paper to SPIE.
* Review, Notification, Program Placement
- To ensure a high-quality conference, all abstracts and Proceedings
manuscripts will be reviewed by the Conference Chair/Editor for
technical merit and suitability of content. Conference Chair/Editors
manuscript revision before approving publication, and reserve the
right to reject for presentation or publication any paper that does
not meet content or presentation expectations. SPIE’s decision on
whether to accept a presentation or publish a manuscript is final.
- Applicants will be notified of abstract acceptance by email no
later than 5 June 2006. Early notification of acceptance will be
placed on SPIE Web the week of 3 July 2006 at spie.org/events/oe
- Final placement in an oral or poster session is subject to the
Chairs' discretion. Instructions for oral and poster presentations
will be included in your author kit. All oral and poster
presentations are included in the Proceedings of SPIE, and require
presentation at the meeting and submission of a manuscript.
* Proceedings of SPIE
- These conferences will result in full-manuscript Chairs/Editor-
reviewed volumes published in the Proceedings of SPIE and in the SPIE
- Correctly formatted, ready-to-print manuscripts submitted in
English are required for all accepted oral and poster presentations.
Electronic submissions are recommended, and result in higher quality
reproduction. Submission must be provided in PostScript created with
a printer driver compatible with SPIE’s online Electronic Manuscript
Submission system. Instructions are included in the author kit and
from the “Author Info” link at the conference website.
- Authors are required to transfer copyright of the manuscript to
SPIE or to provide a suitable publication license.
- Papers published are indexed in leading scientific databases
including INSPEC, Ei Compendex, Chemical Abstracts, International
Aerospace Abstracts, Index to Scientific and Technical Proceedings
Astrophysical Data System, and are searchable in SPIE's Digital
Library. Full manuscripts are available to Digital Library subscribers.
- Late manuscripts may not be published in the conference Proceedings
and SPIE Digital Library, whether the conference volume will be
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is to better serve the conference participants as well as the
technical community at large, by enabling timely publication of the
- Papers not presented at the meeting will not be published in the
conference Proceedings, except in the case of exceptional
the discretion of SPIE and the Conference Chairs/Editors.
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